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Heersche, H.B. (author), Lientschnig, G. (author), O'Neill, K. (author), Van der Zant, H.S.J. (author), Zandbergen, H.W. (author)
The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50?ms of...
journal article 2007
document
Wu, M.Y. (author), Krapf, D. (author), Zandbergen, M. (author), Zandbergen, H. (author), Batson, P.E. (author)
An electron beam can drill nanopores in SiO2 or silicon nitride membranes and shrink a pore to a smaller diameter. Such nanopores are promising for single molecule detection. The pore formation in a 40?nm thick silicon nitride?SiO2 bilayer using an electron beam with a diameter of 8?nm (full width of half height) was investigated by electron...
journal article 2005