de Vries, Tim N.C. (author), Bronkhorst, Joris (author), Vermeer, Martijn (author), Donker, Jaap C.B. (author), Briels, Sven A. (author), Ziar, H. (author), Zeman, M. (author), Isabella, O. (author) A quick-scan yield prediction method has been developed to assess rooftop photovoltaic (PV) potential. The method has three main parts. For each roof, first (i) virtual 3D roof segments were reconstructed using aerial imagery, then, (ii) PV modules were automatically fitted onto roof segments using a fitting algorithm and finally, (iii) expected...
journal article 2020
