Criteria of Grain Refinement Induced by Ultrasonic Melt Treatment of Aluminum Alloys Containing Zr and Ti

Detailed bow-flow data and CFD for a series 60 CB=0.6 ship model for Froude Number 0.316

The Investigation of Separability of Particles Smaller Than 5 mm by Eddy Current Separation Technology. Part I: Rotating Type Eddy Current Separators

A Eulerain-Lagrangian method for the simulation of wave propagation

The Investigation of Separability of Particles Smaller Than 5mm by Eddy-Current Separation Technology - Part II: Novel Design Concepts

Investigation on flip chip solder joint fatigue with cure-dependent underfill properties

Single-electron charging and detection in a laterally coupled quantum-dot circuit in the few-electron regime

Micromechanical modeling of stress evolution induced during cure in a particle-filled electronic packaging polymer

Analysis of directional wave fields with strong current

Finite element analysis of suction penetration seepage field of bucket foundation platform with application to offshore oilfield development

Engineering the quantum point contact response to single-electron charging in a few-electron quantum-dot circuit

Rainfall-runoff modelling in a catchment with a complex groundwater flow system: Application of the representative ElementaryWatershed (REW) approach

An intergrated three-dimensional model for wave-induced seabed response in a porous seabed. I. A sloping seabed

Drying Effects on Corrosion Properties of Cr(VI) and Cr(III) Treated Electrogalvanized Steel

Comparison of two three-dimensional hydrodynamic modeling systems for coastal tidal motion

Fly's proprioception-inspired micromachined strain-sensing structure: Idea, design, modeling and simulation, and comparison with experimental results

Continuous Electrodeless Dielectrophoretic Separation in a Circular Channel

Modelling subsurface storm flow with the Representative Elementary Watershed (REW) approach: Application to the Alzette River Basin

Luminescence of Ce3+ activated fluoro-apatites M5(PO4)3F (M = Ca, Sr, Ba) under VUV—UV and x-ray excitation

Multibeam Electron Source using MEMS Electron Optical Components