Schmidt, S. (author), Klein, A. E. (author), Paul, T. (author), Gross, H. (author), Diziain, S. (author), Steinert, M. (author), da Costa Assafrao, A. (author), Pertsch, T. (author), Urbach, Paul (author), Rockstuhl, C. (author) Aperture based scanning near field optical microscopes are important instruments to study light at the nanoscale and to understand the optical functionality of photonic nanostructures. In general, a detected image is affected by both the transverse electric and magnetic field components of light. The discrimination of the individual field...
journal article 2016
