Searched for: author%3A%22Hamdioui%2C+S.%22
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Bagbaba, Ahmet Cagri (author), Augusto da Silva, F. (author), Sonza Reorda, Matteo (author), Hamdioui, S. (author), Jenihhin, Maksim (author), Sauer, Christian (author)
ISO 26262 requires classifying random hardware faults based on their effects (safe, detected, or undetected) within integrated circuits used in automobiles. In general, this classification is addressed using expert judgment and a combination of tools. However, the growth of integrated circuit complexity creates a huge fault space; hence, this...
journal article 2022
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Siddiqi, M.A. (author), Hahn, Georg (author), Hamdioui, S. (author), Serdijn, W.A. (author), Strydis, C. (author)
A Medical Body Area Network (MBAN) is an ensemble of collaborating, potentially heterogeneous, medical devices located inside, on the surface of or around the human body with the objective of tackling one or multiple medical conditions of the MBAN host. These devices-which are a special category of Wireless Body Area Networks (WBANs)–collect,...
journal article 2022
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Shahroodi, Taha (author), Zahedi, M.Z. (author), Abhairaj Singh, A. (author), Wong, J.S.S.M. (author), Hamdioui, S. (author)
State-of-the-art taxonomic profilers that comprise the first step in larger-context metagenomic studies have proven to be computationally intensive, i.e., while accurate, they come at the cost of high latency and energy consumption. Table Lookup operation is a primary bottleneck of today's profilers. In this paper, we first propose TL-PIM, a...
conference paper 2022
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Köylü, T.C. (author), Caetano Garaffa, L. (author), Reinbrecht, Cezar (author), Zahedi, M.Z. (author), Hamdioui, S. (author), Taouil, M. (author)
The massive deployment of Internet of Things (IoT) devices makes them vulnerable against physical tampering attacks, such as fault injection. These kind of hardware attacks are very popular as they typically do not require complex equipment or high expertise. Hence, it is important that IoT devices are protected against them. In this work, we...
conference paper 2022
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Blanter, Y.M. (author), Carmiggelt, J.J. (author), Cotofana, S.D. (author), Hamdioui, S. (author), Nikitin, A. A. (author), Reimann, T. (author), Sharma, S. (author), van der Sar, T. (author), Zhang, X. (author)
Magnonics addresses the physical properties of spin waves and utilizes them for data processing. Scalability down to atomic dimensions, operation in the GHz-to-THz frequency range, utilization of nonlinear and nonreciprocal phenomena, and compatibility with CMOS are just a few of many advantages offered by magnons. Although magnonics is still...
journal article 2022
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Mahmoud, A.N.N. (author), Cucu Laurenciu, N. (author), Vanderveken, Frederic (author), Ciubotaru, Florin (author), Adelmann, Christoph (author), Cotofana, S.D. (author), Hamdioui, S. (author)
In the early stages of a novel technology development, it is difficult to provide a comprehensive assessment of its potential capabilities and impact. Nevertheless, some preliminary estimates can be drawn and are certainly of great interest and in this paper we follow this line of reasoning within the framework of the Spin Wave (SW) based...
conference paper 2022
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Köylü, T.C. (author), Hamdioui, S. (author), Taouil, M. (author)
Artificial neural networks (ANNs) are used to accomplish a variety of tasks, including safety critical ones. Hence, it is important to protect them against faults that can influence decisions during operation. In this paper, we propose smart and low-cost redundancy schemes that protect the most vulnerable ANN parts against fault attacks....
conference paper 2022
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Fieback, M. (author), Münch, Christopher (author), Gebregiorgis, A.B. (author), Cardoso Medeiros, G. (author), Taouil, M. (author), Hamdioui, S. (author), Tahoori, Mehdi (author)
Emerging non-volatile resistive memories like Spin-Transfer Torque Magnetic Random Access Memory (STT-MRAM) and Resistive RAM (RRAM) are in the focus of today’s research. They offer promising alternative computing architectures such as computation-in-memory (CiM) to reduce the transfer overhead between CPU and memory, usually referred to as the...
conference paper 2022
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Majzoub, Sohaib (author), Saleh, Resve A. (author), Taouil, M. (author), Hamdioui, S. (author), Bamakhrama, Mohamed (author)
Design-space exploration for low-power manycore design is a daunting and time-consuming task which requires some complex tools and frameworks to achieve. In the presence of process variation, the problem becomes even more challenging, especially the time associated with trial-and-error selection of the proper options in the tools to obtain the...
journal article 2022
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Mahmoud, A.N.N. (author), Vanderveken, Frederic (author), Adelmann, Christoph (author), Ciubotaru, Florin (author), Hamdioui, S. (author), Cotofana, S.D. (author)
By their very nature, spin waves (SWs) with different frequencies can propagate through the same waveguide, while mostly interfering with their own species. Therefore, more SW encoded data sets can coexist, propagate, and interact in parallel, which opens the road toward hardware replication-free parallel data processing. In this article, we...
journal article 2021
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Mahmoud, A.N.N. (author), Vanderveken, Frederic (author), Adelmann, Christoph (author), Ciubotaru, Florin (author), Cotofana, S.D. (author), Hamdioui, S. (author)
The key enabling factor for Spin Wave (SW) technology utilization for building ultra low power circuits is the ability to energy efficiently cascade SW basic computation blocks. SW Majority gates, which constitute a universal gate set for this paradigm, operating on phase encoded data are not input output coherent in terms of SW amplitude....
journal article 2021
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Fieback, M. (author), Cardoso Medeiros, G. (author), Gebregiorgis, A.B. (author), Aziza, Hassen (author), Taouil, M. (author), Hamdioui, S. (author)
Industry is prototyping and commercializing Resistive Random Access Memories (RRAMs). Unfortunately, RRAM devices introduce new defects and faults. Hence, high-quality test solutions are urgently needed. Based on silicon measurements, this paper identifies a new RRAM unique fault, the Intermittent Undefined State Fault (IUSF); this fault causes...
conference paper 2021
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Taouil, M. (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Sepulveda, Johanna (author)
Dynamic Random Access Memory (DRAM)-based systems are widely used in mobile and portable applications where low-cost and high-storage memory capability are required. However, such systems are prone to attacks. A latent threat to DRAM-based system security is the so-called Rowhammer attacks. By repeatedly accessing memory, an attacker is able to...
conference paper 2021
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Balakrishnan, Aneesh (author), Cardoso Medeiros, G. (author), Cem Gursoy, Cemil (author), Hamdioui, S. (author), Jenihhin, Maksim (author), Alexandrescu, Dan (author)
The Soft-Error (SE) reliability and the effects of Negative Bias Temperature Instability (NBTI) in deep submicron technologies are characterized as the major critical issues of high-performance integrated circuits. The previous scientific research studies provide a comprehensive description that the soft-error vulnerability becomes more severe...
conference paper 2021
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Diware, S.S. (author), Gebregiorgis, A.B. (author), Joshi, Rajiv V. (author), Hamdioui, S. (author), Bishnoi, R.K. (author)
Emerging memristor-based computing has the potential to achieve higher computational efficiency over conventional architectures. Bit-slicing scheme, which represents a single neural weight using multiple memristive devices, is usually introduced in memristor-based neural networks to meet high bit-precision demands. However, the accuracy of such...
conference paper 2021
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Cardoso Medeiros, G. (author), Fieback, M. (author), Wu, L. (author), Taouil, M. (author), Bolzani Poehls, L. M. (author), Hamdioui, S. (author)
Manufacturing defects can cause hard-to-detect (HTD) faults in fin field-effect transistor (FinFET) static random access memories (SRAMs). Detection of these faults, such as random read outputs and out-of-spec parametric deviations, is essential when testing FinFET SRAMs. Undetected HTD faults result in test escapes, which lead to early in-field...
journal article 2021
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Copetti, Thiago (author), Cardoso Medeiros, G. (author), Taouil, M. (author), Hamdioui, S. (author), Poehls, Leticia Bolzani (author), Balen, Tiago (author)
Fin Field-Effect Transistor (FinFET) technology enables the continuous downscaling of Integrated Circuits (ICs), using the Complementary Metal-Oxide Semiconductor (CMOS) technology in accordance with the More Moore domain. Despite demonstrating improvements on short channel effect and overcoming the growing leakage problem of planar CMOS...
journal article 2021
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Poehls, L. M.Bolzani (author), Fieback, M. (author), Hoffmann-Eifert, S. (author), Copetti, T. (author), Brum, E. (author), Menzel, S. (author), Hamdioui, S. (author), Gemmeke, T. (author)
Complementary Metal Oxide Semiconductor (CMOS) technology has been scaled down over the last forty years making possible the design of high-performance applications, following the predictions made by Gordon Moore and Robert H. Dennard in the 1970s. However, there is a growing concern that device scaling, while maintaining cost-effective...
journal article 2021
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Köylü, T.C. (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)
Artificial neural networks are currently used for many tasks, including safety critical ones such as automated driving. Hence, it is very important to protect them against faults and fault attacks. In this work, we propose two fault injection attack detection mechanisms: one based on using output labels for a reference input, and the other on...
conference paper 2021
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Aljuffri, A.A.M. (author), Zwalua, Marc (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)
Side-channel attacks (SCAs) are powerful attacks that could be used to retrieve keys from electronic devices. Several physical leakage sources can be exploited in SCAs, such as power, time, heat, and so on. Heat is one of the side-channels that is not frequently analyzed by attackers in the literature due to the high noise associated with...
journal article 2021
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