Searched for: author%3A%22Hendrikx%2C+R.W.A.%22
(1 - 4 of 4)
document
Verma, N. (author), Delhez, R. (author), van der Pers, N.M. (author), Hendrikx, R.W.A. (author), Huizenga, R.M. (author), Bottger, A.J. (author)
For Pd thin films, microstructural changes involved during hydrogen cycling provide the information needed to predict and optimize the film's mechanical strength. In this paper, a systematic study of the morphology, microstructure, texture, and stress has been performed on Pd thin films during hydrogen loading and deloading cycles at room...
journal article 2022
document
De Rooi, J.J. (author), Van der Pers, N.M. (author), Hendrikx, R.W.A. (author), Delhez, R. (author), Bottger, A.J. (author), Eilers, P.H.C. (author)
X-ray diffraction scans consist of series of counts; these numbers obey Poisson distributions with varying expected values. These scans are often smoothed and the K2 component is removed. This article proposes a framework in which both issues are treated. Penalized likelihood estimation is used to smooth the data. The penalty combines the...
journal article 2014
document
Van der Pers, N.M. (author), Hendrikx, R.W.A. (author), Delhez, R. (author), Böttger, A.J. (author)
A new diffracted-beam monochromator has been developed for Bragg-Brentano X-ray diffractometers equipped with a linear detector. The monochromator consists of a cone-shaped graphite highly oriented pyrolytic graphite crystal oriented out of the equatorial plane such that the parafocusing geometry is preserved over the whole opening angle of the...
journal article 2013
document
Bottger, A. (author), Delhez, R. (author), Hendrikx, R.W.A. (author), Pers, N.M. (author)
patent 2012
Searched for: author%3A%22Hendrikx%2C+R.W.A.%22
(1 - 4 of 4)