De Rooi, J.J. (author), Van der Pers, N.M. (author), Hendrikx, R.W.A. (author), Delhez, R. (author), Bottger, A.J. (author), Eilers, P.H.C. (author) X-ray diffraction scans consist of series of counts; these numbers obey Poisson distributions with varying expected values. These scans are often smoothed and the K2 component is removed. This article proposes a framework in which both issues are treated. Penalized likelihood estimation is used to smooth the data. The penalty combines the...
journal article 2014