Searched for: author%3A%22Herfst%2C+R.%22
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Bijster, R.J.F. (author), Herfst, R. (author), Klop, W (author), Hagen, R. (author), Sadeghian Marnani, H. (author)
poster 2016
Nanda, G. (author), Veldhoven, E. van (author), Maas, D. (author), Herfst, R. (author), Sadeghian Marnani, H. (author), Alkemade, P.F.A. (author)
abstract 2016
Herfst, R. (author), Dekker, B. (author), Witvoet, G. (author), Crowcombe, W.E. (author), de Lange, D. (author), Sadeghian Marnani, H. (author)
One of the major limitations in the speed of the atomic force microscope (AFM) is the bandwidth of the mechanical scanning stage, especially in the vertical (z) direction. According to the design principles of “light and stiff” and “static determinacy,” the bandwidth of the mechanical scanner is limited by the first eigenfrequency of the AFM...
journal article 2015