- document
-
De Boer, R.W.I. (author), Iosad, N.N. (author), Stassen, A.F. (author), Klapwijk, T.M. (author), Morpurgo, A.F. (author)We investigate the effect of a small leakage current through the gate insulator on the stability of organic single-crystal field-effect transistors (FETs). We find that, irrespective of the specific organic molecule and dielectric used, leakage current flowing through the gate insulator results in an irreversible degradation of the single...journal article 2005
- document
- Iosad, N.N. (author), van der Pers, N.M. (author), Grachev, S. (author), Zuiddam, M. (author), Jackson, B.D. (author), Dmitriev, P.N. (author), Klapwijk, T.M. (author) journal article 2003
- document
- Iosad, N.N. (author), Kroug, M. (author), Zijlstra, T. (author), Ermakov, A.B. (author), Jackson, B.D. (author), Zuiddam, M. (author), Meijer, F.E. (author), Klapwijk, T.M. (author) journal article 2003
- document
- Iosad, N.N. (author), Roddatis, V.V. (author), Polyakov, S.N. (author), Varlashkin, A.V. (author), Jackson, B.D. (author), Dmitriev, P.N. (author), Gao, J.R. (author), Klapwijk, T.M. (author) journal article 2001