Dynamics and control of Atomic Force Microscopy

The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth century which substantially contributed to our understanding of the nanoscale world. In contrast to other microscopy techniques, the AFM does not operate based on the electromagnetic waves, but nano-mechanical interactions between the sample surface...

A comprehensive model for transient behavior of tapping mode atomic force microscope

Many investigations have focused on steady-state nonlinear dynamics of cantilevers in tapping mode atomic force microscopy (TM-AFM). However, a transient dynamic model—which is essential for a model-based control design—is still missing. In this paper, we derive a mathematical model which covers both the transient and steady-state behavior....

On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy

The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides...

Minimizing tip-sample forces and enhancing sensitivity in atomic force microscopy with dynamically compliant cantilevers

Due to the harmonic motion of the cantilever in Tapping Mode Atomic Force Microscopy, it is seemingly impossible to estimate the tip-sample interactions from the motion of the cantilever. Not directly observing the interaction force, it is possible to damage the surface or the tip by applying an excessive mechanical load. The tip-sample...

Chaos: The speed limiting phenomenon in dynamic atomic force microscopy

This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mode AFM strictly limits the imaging speed. We show that, if the...

Quantitative measurement of tip-sample interaction forces in tapping mode atomic force microscopy

Transient tip-sample interactions in high-speed AFM imaging of 3D nano structures

The maximum amount of repulsive force applied to the surface plays a very important role in damage of tip or sample in Atomic Force Microscopy(AFM). So far, many investigations have focused on peak repulsive forces in tapping mode AFM in steady state conditions. However, it is known that AFM could be more damaging in transient conditions. In...