Towards information storage by designing both electron and hole detrapping processes in bismuth and lanthanide-doped LiRE(Si,Ge)O₄ (RE = Y, Lu) with high charge carrier storage capacity

Guided by vacuum referred binding energy (VRBE) diagrams, both the trapping and detrapping processes of electrons and holes are explored in the bismuth and lanthanide-doped LiRE(Si,Ge)O₄ (RE = Y, Lu) family of compounds. The Tm³⁺ electron trap has been combined with the deep hole traps of Ln³⁺ (Ln = Ce, Tb, or...