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Esposito, C. (author), De Martino, C. (author), Lehmann, S. (author), Zhao, Z. (author), Mothes, S. (author), Kretzschmar, C. (author), Schroter, M. (author), Spirito, M. (author)
In this contribution, We analyze the bandwidth versus accuracy trade-offs of conventional two-step de-embedding approaches, often employed to extract the device model parameters. The accuracy limitation of incorporating the pad/line section of classical DUT test-fixtures into shunt-series complex and frequency-dependent elements is analyzed by...
conference paper 2022