Searched for: author%3A%22Nanda%2C+G.%22
(1 - 6 of 6)
document
Nanda, G. (author)
This thesis describes the capabilities of the helium ion microscope (HIM) and that of graphene to explore fundamental physics and novel applications. While graphene offers superior electronic properties, the helium ion microscope allows us to combine imaging and modification of materials at the nanoscale. We used the capabilities of HIM to grow...
doctoral thesis 2017
document
Nanda, G. (author), Hlawacek, Gregor (author), Goswami, S. (author), Watanabe, Kenji (author), Taniguchi, Takashi (author), Alkemade, P.F.A. (author)
We report the etching of and electronic transport in nanoribbons of graphene sandwiched between atomically flat hexagonal boron nitride (h-BN). The etching of ribbons of varying width was achieved with a focused beam of 30 keV He<sup>+</sup> ions. Using in-situ electrical measurements, we established a critical dose of 7000 ions nm<sup>−2<...
journal article 2017
document
Nanda, G. (author), Aguilera Servin, J.L. (author), Rakyta, P. (author), Kormányos, A. (author), Kleiner, Reinhold (author), Koelle, Dieter (author), Watanabe, K. (author), Taniguchi, T. (author), Vandersypen, L.M.K. (author), Goswami, S. (author)
The current-phase relation (CPR) of a Josephson junction (JJ) determines how the supercurrent evolves with the superconducting phase difference across the junction. Knowledge of the CPR is essential in order to understand the response of a JJ to various external parameters. Despite the rising interest in ultraclean encapsulated graphene JJs,...
journal article 2017
document
van der Walle, P (author), Kramer, E. (author), van der Donck, J.C.J. (author), Mulckhuyse, W (author), Nijsten, L. (author), Bernal Arango, F.A. (author), de Jong, A. (author), van Zeijl, E. (author), Spruit, H. E.T. (author), van den Berg, J.H. (author), Nanda, G. (author), van Langen-Suurling, A.K. (author), Alkemade, P.F.A. (author), Pereira, S.F. (author), Maas, D.J. (author)
Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distinguishes three consecutive steps; detection, review and...
conference paper 2017
document
Nanda, G. (author), Veldhoven, E. van (author), Maas, D. (author), Herfst, R. (author), Sadeghian Marnani, H. (author), Alkemade, P.F.A. (author)
abstract 2016
document
Nanda, G. (author), Van Veldhoven, E. (author), Maas, D. (author), Sadeghian, H. (author), Alkemade, P.F.A. (author)
The authors report the direct-write growth of hammerhead atomic force microscope(AFM) probes by He+beam induced deposition of platinum-carbon. In order to grow a thin nanoneedle on top of a conventional AFM probe, the authors move a focused He+beam during exposure to a PtC precursor gas. In the final growth stage, a perpendicular movement of the...
journal article 2015
Searched for: author%3A%22Nanda%2C+G.%22
(1 - 6 of 6)