Extending the Open-Short de-embedding frequency via metal-l on-wafer calibration approaches

In this contribution, We analyze the bandwidth versus accuracy trade-offs of conventional two-step de-embedding approaches, often employed to extract the device model parameters. The accuracy limitation of incorporating the pad/line section of classical DUT test-fixtures into shunt-series complex and frequency-dependent elements is analyzed by...

Employing M1 direct calibration/de-embedding approaches for large signal model validation at mm-wave frequencies

In this contribution, we employ direct calibration/de-embedding approaches to validate the large signal device model of state-of-the-art HBTs and CMOS technologies operating in the mm-wave frequency band WR6. The capability of placing the first tier calibration reference plane in close proximity to the DUT allows the large signal metric to be...