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Heydarian, H. (author), Schueder, Florian (author), Strauss, Maximilian T. (author), van Werkhoven, Ben (author), Fazel, Mohamadreza (author), Lidke, K.A. (author), Jungmann, Ralf (author), Stallinga, S. (author), Rieger, B. (author)
Methods that fuse multiple localization microscopy images of a single structure can improve signal-to-noise ratio and resolution, but they generally suffer from template bias or sensitivity to registration errors. We present a template-free particle-fusion approach based on an all-to-all registration that provides robustness against...
journal article 2018