Searched for: author:"Tichelaar, F.D."
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Feng, J. (author), Chen, Dong (author), Sediq, Ahmad S. (author), Romeijn, Stefan (author), Tichelaar, F.D. (author), Jiskoot, Wim (author), Koper, M.T.M. (author)
A key enabling step in leveraging the properties of nanoparticles (NPs) is to explore new, simple, controllable, and scalable nanotechnologies for their syntheses. Among "wet" methods, cathodic corrosion has been used to synthesize catalytic aggregates with some control over their size and preferential faceting. Here, we report on a...
journal article 2018
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Liu, C. (author), Malladi, S.R.K. (author), Xu, Q. (author), Chen, Jianghua (author), Tichelaar, F.D. (author), Zhuge, Xiaodong (author), Zandbergen, H.W. (author)
Age-hardening in Al alloys has been used for over a century to improve its mechanical properties. However, the lack of direct observation limits our understanding of the dynamic nature of the evolution of nanoprecipitates during age-hardening. Using in-situ (scanning) transmission electron microscopy (S/TEM) while heating an Al-Cu alloy, we...
journal article 2017
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Norouzi Afshar, F. (author), Tichelaar, F.D. (author), Glenn, A. M. (author), Taheri, P. (author), Sababi, M. (author), Terryn, H.A. (author), Mol, J.M.C. (author)
This work studies the influence of the microstructure on the corrosion mechanism and susceptibility of as-brazed aluminum sheet. Various microstructures are obtained using postbrazing heat treatments developed to enhance the corrosion resistance of an AA4xxx/AA3xxx brazing sheet. The heat treatment results in a decrease of the matrix Si...
journal article 2017
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Zhang, S. (author), Fang, H. (author), Gramsma, M. E. (author), Kwakernaak, C. (author), Sloof, W.G. (author), Tichelaar, F.D. (author), Kuzmina, M (author), Herbig, M (author), Raabe, D. (author), Brück, E.H. (author), van der Zwaag, S. (author), van Dijk, N.H. (author)
We have investigated the autonomous repair of creep damage by site-selective precipitation in a binary Fe-Mo alloy (6.2 wt pct Mo) during constant-stress creep tests at temperatures of 813 K, 823 K, and 838 K (540 °C, 550 °C, and 565 °C). Scanning electron microscopy studies on the morphology of the creep-failed samples reveal irregularly...
journal article 2016
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Zhang, S. (author), Kwakernaak, C. (author), Tichelaar, F.D. (author), Sloof, W.G. (author), Kuzmina, M. (author), Herbig, M. (author), Raabe, D. (author), Brück, E. (author), Van der Zwaag, S. (author), Van Dijk, N.H. (author)
The autonomous repair mechanism of creep cavitation during high-temperature deformation has been investigated in Fe-Au and Fe-Au-B-N alloys. Combined electron-microscopy techniques and atom probe tomography reveal how the improved creep properties result from Au precipitation within the creep cavities, preferentially formed on grain boundaries...
journal article 2015
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Cartamil Bueno, S.J. (author), Steeneken, P.G. (author), Tichelaar, F.D. (author), Navarro Moratalla, E. (author), Venstra, W.J. (author), Leeuwen, R. (author), Coronado, E. (author), Van der Zant, H.S.J. (author), Steele, G.A. (author), Castellanos-Gomez, A. (author)
Controlling the strain in two-dimensional (2D) materials is an interesting avenue to tailor the mechanical properties of nanoelectromechanical systems. Here, we demonstrate a technique to fabricate ultrathin tantalum oxide nanomechanical resonators with large stress by the laser oxidation of nano-drumhead resonators composed of tantalum...
journal article 2015
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Fan, Z. (author), Koster, R.S. (author), Wang, S. (author), Fang, C. (author), Yalcin, A.O. (author), Tichelaar, F.D. (author), Zandbergen, H.W. (author), Van Huis, M.A. (author), Vlugt, T.J.H. (author)
journal article 2014
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Yalcin, A.O. (author), Goris, B. (author), Van Dijk-Moes, R.J.A. (author), Fan, Z. (author), Erdamar, A.K. (author), Tichelaar, F.D. (author), Vlugt, T.J.H. (author), Van Tendeloo, G. (author), Bals, S. (author), Vanmaekelbergh, D. (author), Zandbergen, H.W. (author), Van Huis, M.A. (author)
In this work, we investigate the thermal evolution of CdSe–CdS–ZnS core–multishell quantum dots (QDs) in situ using transmission electron microscopy (TEM). Starting at a temperature of approximately 250 °C, Zn diffusion into inner layers takes place together with simultaneous evaporation of particularly Cd and S. As a result of this...
journal article 2014
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Yalcin, A.O. (author), Fan, Z. (author), Goris, B. (author), Li, W.F. (author), Koster, R.S. (author), Fang, C.M. (author), Van Blaaderen, A. (author), Casavola, M. (author), Tichelaar, F.D. (author), Bals, S. (author), Van Tendeloo, G. (author), Vlugt, T.J.H. (author), Vanmaekelbergh, D. (author), Zandbergen, H.W. (author), Van Huis, M.A. (author)
Here, we show a novel solid?solid?vapor (SSV) growth mechanism whereby epitaxial growth of heterogeneous semiconductor nanowires takes place by evaporation-induced cation exchange. During heating of PbSe-CdSe nanodumbbells inside a transmission electron microscope (TEM), we observed that PbSe nanocrystals grew epitaxially at the expense of CdSe...
journal article 2014
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Tran, A.T. (author), Pandraud, G. (author), Tichelaar, F.D. (author), Nguyen, M.D. (author), Schellevis, H. (author), Sarro, P.M. (author)
The structure of AlN layers grown on Ti with and without an AlN interlayer between the Si substrate and the Ti layer is investigated. The AlN grains take over the orientation of the Ti columnar grains in both cases. Surprisingly, the Ti grains do not take over completely the orientations of the AlN grains of the interlayer, and show the same...
journal article 2013
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Sharma, K. (author), Ponomarev, M.V. (author), Verheijen, M.A. (author), Kunz, O. (author), Tichelaar, F.D. (author), Van de Sanden, M.C.M. (author), Creatore, M. (author)
In this paper, we report on the deposition of amorphous silicon (a-Si:H) films at ultra-high growth rate (11–60?nm/s) by means of the expanding thermal plasma technique, followed by solid-phase crystallization (SPC). Large-grain (?1.5??m) polycrystalline silicon was obtained after SPC of high growth rate (?25?nm/s) deposited a-Si:H films. The...
journal article 2012
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Tirumalasetty, G.K. (author), Van Huis, M.A. (author), Fang, C.M. (author), Xu, Q. (author), Tichelaar, F.D. (author), Hanlon, D.N. (author), Sietsma, J. (author), Zandbergen, H.W. (author)
Multiphase steels utilising composite strengthening may be further strengthened via grain refinement or precipitation by the addition of microalloying elements. In this study a Nb microalloyed steel comprising martensite, bainite and retained austenite has been studied. By means of transmission electron microscopy (TEM), we have investigated the...
journal article 2011
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He, S.M. (author), Van Dijk, N.H. (author), Paladugu, M. (author), Schut, H. (author), Kohlbrecher, J. (author), Tichelaar, F.D. (author), Van der Zwaag, S. (author)
We performed in situ time-resolved small-angle neutron scattering (SANS) measurements on high-purity Fe-Cu and Fe-Cu-B-N alloys during isothermal aging at 550 °C in order to study the potential self-healing of deformation-induced defects by nanosized Cu precipitation. Three different samples with 0%, 8%, and 24% prestrain were used to study the...
journal article 2010
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Mele, L. (author), Santagata, F. (author), Panraud, G. (author), Morana, B. (author), Tichelaar, F.D. (author), Creemer, J.F. (author), Sarro, P.M. (author)
This paper presents a new process for the fabrication of MEMS-based nanoreactors for in situ atomic-scale imaging of nanoparticles under relevant industrial conditions. The fabrication of the device is completed fully at wafer level in an ISO 5 clean room and it is based on silicon fusion bonding and thin film encapsulation for sealed lateral...
journal article 2010
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Pujada, B.R. (author), Tichelaar, F.D. (author), Arnoldbik, W.M. (author), Sloof, W.G. (author), Janssen, G.C.A.M. (author)
Growth stress in tungsten carbide-diamond-like carbon coatings, sputter deposited in a reactive argon/acetylene plasma, has been studied as a function of the acetylene partial pressure. Stress and microstructure have been investigated by wafer curvature and transmission electron microscopy (TEM) whereas composition and energy distribution...
journal article 2009
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Zijlstra, T. (author), Lodewijk, C.F.J. (author), Vercruyssen, N. (author), Tichelaar, F.D. (author), Loudkov, D.N. (author), Klapwijk, T.M. (author)
High critical current-density (10?to?420?kA/cm2) superconductor-insulator-superconductor tunnel junctions with aluminum nitride barriers have been realized using a remote nitrogen plasma from an inductively coupled plasma source operated in a pressure range of 10?3–10?1?mbar. We find a much better reproducibility and control compared to previous...
journal article 2007
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Gao, J.R. (author), Hajenius, M. (author), Tichelaar, F.D. (author), Klapwijk, T.M. (author), Voronov, B. (author), Grishin, E. (author), Gol'tsman, G. (author), Zorman, C.A. (author), Mehregany, M. (author)
The authors have realized NbN (100) nanofilms on a 3C-SiC (100)/Si(100) substrate by dc reactive magnetron sputtering at 800?°C. High-resolution transmission electron microscopy (HRTEM) is used to characterize the films, showing a monocrystalline structure and confirming epitaxial growth on the 3C-SiC layer. A film ranging in thickness from 3.4...
journal article 2007
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Cheynet, M.C. (author), Pokrant, S. (author), Tichelaar, F.D. (author), Rouvière, J.L. (author)
Valence electron energy loss spectroscopy (VEELS) and high resolution transmission electron microscopy (HRTEM) are performed on three different HfO2 thin films grown on Si (001) by chemical vapor deposition (CVD) or atomic layer deposition (ALD). For each sample the band gap (Eg) is determined by low-loss EELS analysis. The Eg values are then...
journal article 2007
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Pujada, B.R. (author), Tichelaar, F.D. (author), Janssen, G.C.A.M. (author)
Tungsten carbide-diamond like carbon (WC-DLC) multilayer coatings have been prepared by sputter deposition from a tungsten-carbide target and periodic switching on and off of the reactive acetylene gas flow. The stress in the resulting WC-DLC multilayers has been studied by substrate curvature. Periodicity and microstructure have been studied by...
journal article 2007
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Janssen, G.C.A.M. (author), Tichelaar, F.D. (author), Visser, C.C.G. (author)
Stress in hard films is the net sum of tensile stress generated at the grain boundaries, compressive stress due to ion peening, and thermal stress due to the difference in thermal expansion of the coating and substrate. The tensile part due to grain boundaries is thickness dependent. The other two contributions are not thickness dependent....
journal article 2006
Searched for: author:"Tichelaar, F.D."
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