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Zandbergen, H.W. (author), Ahn, C.W. (author)A method for sample preparation for cryoelectron microscopy (CEM), wherein the sample is held in a microreactor, wherein the conditions in the microreactor are regulated relative to the environment, wherein the sample in the microreactor is frozen according to a quench freeze process, whereupon the sample, in frozen condition, is placed in the...patent 2008
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Heersche, H.B. (author), Lientschnig, G. (author), O'Neill, K. (author), Van der Zant, H.S.J. (author), Zandbergen, H.W. (author)The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50?ms of...journal article 2007
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- Lau, G.C. (author), Freitas, R.S. (author), Ueland, B.G (author), Dahlberg, M.L. (author), Huang, Q. (author), Zandbergen, H.W. (author), P. Schiffer, P. (author), Cava1, R.J. (author) journal article 2007
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- Zandbergen, H.W. (author), Pao, C.W. (author), Srolovitz, D.J. (author) journal article 2007
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- Van Huis, M.A. (author), Sluiter, M.H.F. (author), Chen, J.H. (author), Zandbergen, H.W. (author) journal article 2007
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- Pao, C.W. (author), Srolovitz, D.J. (author), Zandbergen, H.W. (author) journal article 2007
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- Morosan, E. (author), Zandbergen, H.W. (author), Li, L. (author), Lee, M. (author), Checkelsky, J.G. (author), Heinrich, M. (author), Siegrist, T. (author), Ong, N.P. (author), Cava1, R.J. (author) journal article 2007
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- Bos, J.W.G. (author), Zandbergen, H.W. (author), Lee, M.H. (author), Ong, N.P. (author), Cava, R.J. (author) journal article 2007
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Klimczuk, T. (author), Xu, Q. (author), Morosan, E. (author), Thompson, J.D. (author), Zandbergen, H.W. (author), Cava, R.J. (author)Mg10Ir19B16, a previously unreported compound in the Mg-Ir-B chemical system, is found to be superconducting at temperatures near 5 K. The fact that the compound exhibits a range of superconducting temperatures between 4 and 5 K suggests that a range of stoichiometries is allowed, though no structural evidence for this is observed. The compound...journal article 2006
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Bos, J.W.G. (author), Lee, M. (author), Morosan, E. (author), Zandbergen, H.W. (author), Lee, W.L. (author), Ong, N.P. (author), Cava, R.J. (author)Ferromagnetism is observed below 10 K in [Bi0.75Te0.125Mn0.125]Te. This material has the BiTe structure, which is made from the stacking of two Te-Bi-Te-Bi-Te blocks and one Bi-Bi block per unit cell. Crystal structure analysis shows that Mn is localized in the Bi2 blocks, and is accompanied by an equal amount of TeBi antisite occupancy in the...journal article 2006
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Creemer, J.F. (author), Zandbergen, H.W. (author), Sarro, P.M. (author)A microreactor for use in a microscope, comprising a first and second cove layer (13) , which cover layers are both at least partly transparent to an electron beam (14) of an electron microscope, and extend next to each other at a mutual distance from each other and between which a chamber (15) is enclosed, wherein an inlet (4) and an outlet (5)...patent 2006
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Yang, Z.Q. (author), Zhang, Y.Q. (author), Aarts, J. (author), Wu, M.Y. (author), Zandbergen, H.W. (author)We report the effects of biaxial strain on the charge ordering temperature Tco of the mixed-valent manganite perovskite oxide Pr0.5Ca0.5MnO3. Thin films were grown on SrTiO3, which has a 1.3% larger in-plane lattice parameter. Other substrates were used for comparison. Transport measurements combined with data from electron microscopy show that...journal article 2006
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Zandbergen, H.W. (author), Tichelaar, F.D. (author), Alkemade, P.F.A. (author)A method for the formation of nanometer-scale electrodes, wherein strip of electrically conductive material, in particular metal, is provided with a longitudinal direction, a width direction and a thickness direction and then, with the aid of an electron beam, a groove is provided in a top surface of the strip, in the width direction of the...patent 2006
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- Viciu, L. (author), Bos, J.W.G. (author), Zandbergen, H.W. (author), Huang, Q. (author), Foo, M.L. (author), Ishiwata, S. (author), Ramirez, A.P. (author), Lee, M. (author), Ong, N.P. (author), Cava, R.J. (author) journal article 2006
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- Moreno, M.S. (author), Lazar, S. (author), Zandbergen, H.W. (author), Egerton, R.F. (author) journal article 2006
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Storm, A.J. (author), Chen, J.H. (author), Ling, X.S. (author), Zandbergen, H.W. (author), Dekker, C. (author)The imaging beam of a transmission electron microscope can be used to fine tune critical dimensions in silicon oxide nanostructures. This technique is particularly useful for the fabrication of nanopores with single-nanometer precision, down to 2 nm. We report a detailed study on the effect of electron-beam irradiation on apertures with various...journal article 2005
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- Andersen, E.N. (author), Klimczuk, T. (author), Miller, V.L. (author), Zandbergen, H.W. (author), Cava, R.J. (author) journal article 2005
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- Storm, A.J. (author), Chen, J.H. (author), Zandbergen, H.W. (author), Dekker, C. (author) journal article 2005
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Storm, A.J. (author), Zandbergen, H.W. (author)The invention relates to a method for manufacturing nanometer-scale apertures, wherein, in an object, in a conventional manner, at least one aperture is provided with a nanometer-scale surface area, after which, by means of an electron beam, energy is supplied to at least the edge of said at least one aperture, such that the surface area of the...patent 2004
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Lazar, S. (author), Weyher, J.L. (author), Macht, L. (author), Tichelaar, F.D. (author), Zandbergen, H.W. (author)Photochemical (PEC) etching and transmission electron microscopy (TEM) have been used to study the defects in hetero-epitaxial GaN layers. TEM proved that PEC etching reveals not only dislocations but also nanopipes in the form of protruding, whisker-like etch features. It is shown by diffraction contrast techniques that the nanopipes are screw...journal article 2004