Searched for: author%3A%22van+Keulen%2C+A.%22
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Bijster, R.J.F. (author), van Keulen, A. (author)
Multilayer cantilever beams are used in the measurement of near-field radiative heat transfer. The materials and dimensions of the cantilever probe are chosen in order to improve system performance in terms of sensitivity and noise. This is done using an analytical model that describes the thermo-mechanical and mechanical behavior of the...
journal article 2021
document
Bijster, R.J.F. (author), Sadeghian Marnani, H. (author), van Keulen, A. (author)
abstract 2016
document
Bijster, R.J.F. (author), Sadeghian Marnani, H. (author), van Keulen, A. (author)
abstract 2016
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Bijster, R.J.F. (author), Sadeghian Marnani, H. (author), van Keulen, A. (author)
poster 2016
document
Bijster, R.J.F. (author), Sadeghian Marnani, H. (author), van Keulen, A. (author)
Optical near-field technologies such as solid immersion lenses and hyperlenses are candidate solutions for high resolution and high throughput wafer inspection and metrology for the next technology nodes. Besides sub-diffraction limited optical performance, these concepts share the necessity of extreme proximity to the sample at distances that...
conference paper 2016
Searched for: author%3A%22van+Keulen%2C+A.%22
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