In situ imaging of electromigration-induced nanogap formation by transmission electron microscopy

The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50?ms of...

Thin films of the charge-density-wave oxide Rb(0.30) MoO(3) by pulsed-laser deposition

In Situ transmission electron microscopy imaging of electromigration in platinum nanowires

In situ transmission electron microscopy was performed on the electromigration in platinum (Pt) nanowires (14 nm thick, 200 nm wide, and 300 nm long) with and without feedback control. Using the feedback control mode, symmetric electrodes are obtained and the gap usually forms at the center of the Pt nanowire. Without feedback control,...