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Heersche, H.B. (author), Lientschnig, G. (author), O'Neill, K. (author), Van der Zant, H.S.J. (author), Zandbergen, H.W. (author)The authors imaged electromigration-induced nanogap formation in situ by transmission electron microscopy. Real-time video recordings show that edge voids form near the cathode side. The polycrystalline gold wires narrow down until a single-grain boundary intersects the constriction along which the breaking continues. During the last 50?ms of...journal article 2007
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Wu, M.Y. (author), Krapf, D. (author), Zandbergen, M. (author), Zandbergen, H. (author), Batson, P.E. (author)An electron beam can drill nanopores in SiO2 or silicon nitride membranes and shrink a pore to a smaller diameter. Such nanopores are promising for single molecule detection. The pore formation in a 40?nm thick silicon nitride?SiO2 bilayer using an electron beam with a diameter of 8?nm (full width of half height) was investigated by electron...journal article 2005