Searched for: collection%3Air
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document
Caron, L. (author), Miao, X.F. (author), Klaasse, J.C.P. (author), Gama, S. (author), Brück, E. (author)
Structural, magnetic, and magnetocaloric properties of Mn2-xCrxSb compounds have been studied. In these compounds, a first order magnetic phase transition from the ferrimagnetic to the antiferromagnetic state occurs with decreasing temperature, giving rise to giant inverse magnetocaloric effects that can be tuned over a wide temperature interval...
journal article 2013
document
Trung, N.T. (author), Biharie, V. (author), Zhang, L. (author), Caron, L. (author), Buschow, K.H.J. (author), Brück, E.H. (author)
Substitution of some Cr for Mn atoms in MnCoGe was employed to control the magnetic and structural transitions in this alloy to coincide, leading to a single first-order magnetostructural transition from the ferromagnetic to the paramagnetic state with a giant magnetocaloric effect observed near room temperature. Further increase in the Cr...
journal article 2010
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Goennenwein, S.T.B. (author), Schink, S.W. (author), Brandlmaier, A. (author), Boger, A. (author), Opel, M. (author), Gross, R. (author), Keizer, R.S. (author), Klapwijk, T.M. (author), Gupta, A. (author), Huebl, H. (author), Bihler, C. (author), Brandt, M.S. (author)
We study the magnetoresistance properties of thin ferromagnetic CrO2 and Fe3O4 films under microwave irradiation. Both the sheet resistance ? and the Hall voltage VHall characteristically change when a ferromagnetic resonance (FMR) occurs in the film. The electrically detected ferromagnetic resonance (EDFMR) signals closely match the...
journal article 2007
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Goennenwein, S.T.B. (author), Keizer, R.S. (author), Schink, S.W. (author), Van Dijk, I. (author), Klapwijk, T.M. (author), Miao, G.X. (author), Xiao, G. (author), Gupta, A. (author)
We have measured the in-plane anisotropic magnetoresistance of 100?nm thick CrO2 thin films at liquid He temperatures. In low magnetic fields H, both the longitudinal and the transverse (planar Hall) resistance show abrupt switches, which characteristically depend on the orientation of H. All the experimental findings consistently demonstrate...
journal article 2007
document
Janssen, G.C.A.M. (author), Tichelaar, F.D. (author), Visser, C.C.G. (author)
Stress in hard films is the net sum of tensile stress generated at the grain boundaries, compressive stress due to ion peening, and thermal stress due to the difference in thermal expansion of the coating and substrate. The tensile part due to grain boundaries is thickness dependent. The other two contributions are not thickness dependent....
journal article 2006
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