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Meskers, A.J.H. (author), Spronck, J.W. (author), Munnig Schmidt, R.H. (author)
The use of optical fibers presents several advantages with respect to free-space optical transport regarding sourcefrequency delivery to individual heterodyne interferometers. Unfortunately, fiber delivery to individual coaxial heterodyne interferometers leads to an increase of (periodic) nonlinearity in the measurement, because transporting...
journal article 2014
document
Meskers, A.J.H. (author), Spronck, J.W. (author), Munnig Schmidt, R.H. (author)
Periodic nonlinearity (PNL) in displacement interferometers is a systematic error source that limits measurement accuracy. The PNL of coaxial heterodyne interferometers is highly influenced by the polarization state and orientation of the source frequencies. In this Letter, we investigate this error source and discuss two interferometer designs,...
journal article 2014
document
Ellis, J.D. (author), Meskers, A.J.H. (author), Spronck, J.W. (author), Munnig Schmidt, R.H. (author)
Displacement interferometry is widely used for accurately characterizing nanometer and subnanometer displacements in many applications. In many modern systems, fiber delivery is desired to limit optical alignment and remove heat sources from the system, but fiber delivery can exacerbate common interferometric measurement problems, such as...
journal article 2011
document
Ellis, J.D. (author), Joo, K.N. (author), Spronck, J.W. (author), Munnig Schmidt, R.H. (author)
We describe two different, double-sided interferometer designs for measuring material stability. Both designs are balanced interferometers where the only optical path difference is the sample and the reference beams are located within the interferometer. One interferometer is a double-pass design, whereas the other is a single-pass system. Based...
journal article 2009
document
Joo, K.N. (author), Ellis, J.D. (author), Spronck, J.W. (author), Van Kan, P.J.M. (author), Munnig Schmidt, R.H. (author)
We describe a simple heterodyne laser interferometer that has subnanometer periodic errors and is applicable to industrial fields. Two spatially separated beams can reduce the periodic errors, and the use of a right-angle prism makes the optical configuration much simpler than previous interferometers. Moreover, the optical resolution can be...
journal article 2009
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