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Neklyudova, M. (author), Erdamar, A.K. (author), Vicarelli, L. (author), Heerema, S.J. (author), Rehfeldt, T. (author), Pandraud, G. (author), Koladouz Esfahani, Z. (author), Dekker, C. (author), Zandbergen, H.W. (author)
We present a technique to fabricate ultrathin (down to 20 nm) uniform electron transparent windows at dedicated locations in a SiN membrane for in situ transmission electron microscopy experiments. An electron-beam (e-beam) resist is spray-coated on the backside of the membrane in a KOH-etched cavity in silicon which is patterned using...
journal article 2017
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Neklyudova, M. (author), Sabater, C. (author), Erdamar, A.K. (author), Van Ruitenbeek, J. M. (author), Zandbergen, H.W. (author)
We have performed a range of in situ heating experiments of polycrystalline Bi films of 22-25 nm-thickness in a transmission electron microscope (TEM). This shows that it is possible to locally transform a polycrystalline thin film into a [111]-oriented single-crystalline film, whereby the unique feature is that the original thickness of the...
journal article 2017