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Bernardi, P. (author), Cantoro, R. (author), Coyette, A. (author), Dobbeleare, W. (author), Fieback, M. (author), Floridia, A. (author), Gielenk, G. (author), Guerriero, A. M. (author), Hamdioui, S. (author)
Electronics employed in modern safety-critical systems require severe qualification during the manufacturing process and in the field, to prevent fault effects from manifesting themselves as critical failures during mission operations. Traditional fault models are not sufficient anymore to guarantee the required quality levels for chips...
conference paper 2022
Augusto da Silva, F. (author), Bagbaba, Ahmet Cagri (author), Hamdioui, S. (author), Sauer, Christian (author)
Tolerance to random hardware failures, required by ISO26262, entails accurate design behavior analysis, complex Verification Environments and expensive Fault Injection campaigns. This paper proposes a methodology combining the strengths of Automatic Test Pattern Generators (ATPG), Formal Methods and Fault Injection Simulation to decrease the...
conference paper 2019