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Searched for: contributor%3A%22Kruit%2C+P.+%28promotor%29%22
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Electrostatic Lens System Design and Optimization Using Evolutionary Algorithms
Cleanroom in an SEM
High Speed Electron Microscopy: Engineering of a commercial multi-beam scanning electron microscope with transmission imaging
Controlled nano-patterning using focused electron beam induced deposition
Development and application of ultrafast scanning electron microscopy
Physics and applications of electron-matter interaction simulations
Creation of electron pulses with a laser-triggered micro fabricated electron beam deflector
Simulation of Electron-Matter Interaction in Electron Beam Lithography and Metrology
Electron wave front modulation with patterned mirrors
Electron beam technology for single nanometer fabrication
High resolution resist-free lithography in the SEM
Imaging systems in the Delft Multi-Beam Scanning Electron Microscope 1
The Nano-Aperture Ion Source
Individual beam control in multi electron beam systems
Quantum Noise Effects in e-Beam Lithography and Metrology
Development of the Nano-Aperture Ion Source (NAIS)
Simultaneous Correlative Light and Electron Microscopy of Samples in Liquid
Cathodoluminescence Microscopy of Nanostructures on Transparent Substrates
Brightness limitations in sources for static and ultra-fast high resolution electron microscopy
196 Beams in a Scanning Electron Microscope
Searched for: contributor%3A%22Kruit%2C+P.+%28promotor%29%22
(1 - 20 of 49)
Document type
Date
Pages
1
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3
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