Reliability study of the Floating Gate Based Embedded Non?Volatile Memory (eNVM)

The task of this project is to investigate the reliability aspects of NXP 2T?FNFN?NOR embedded non?volatile memories (eNVM). The structure of the memory cell is presented and its principle of operations is described. The reliability aspects (mainly endurance & retention) of the floating gate memory cell are inspected. Methods are presented to...