Searched for: department%3A%22Computer%255C%252BEngineering%22
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Diware, S.S. (author), Singh, A. (author), Gebregiorgis, A.B. (author), Joshi, Rajiv V. (author), Hamdioui, S. (author), Bishnoi, R.K. (author)
Computation-in-memory (CIM) paradigm leverages emerging memory technologies such as resistive random access memories (RRAMs) to process the data within the memory itself. This alleviates the memory-processor bottleneck resulting in much higher hardware efficiency compared to von-Neumann architecture-based conventional hardware. Hence, CIM...
journal article 2023
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Diware, S.S. (author), Dash, Sudeshna (author), Gebregiorgis, A.B. (author), Joshi, Rajiv V. (author), Strydis, C. (author), Hamdioui, S. (author), Bishnoi, R.K. (author)
Timely detection of cardiac arrhythmia characterized by abnormal heartbeats can help in the early diagnosis and treatment of cardiovascular diseases. Wearable healthcare devices typically use neural networks to provide the most convenient way of continuously monitoring heart activity for arrhythmia detection. However, it is challenging to...
journal article 2023
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Köylü, T.C. (author), Reinbrecht, Cezar (author), Gebregiorgis, A.B. (author), Hamdioui, S. (author), Taouil, M. (author)
Hardware security is currently a very influential domain, where each year countless works are published concerning attacks against hardware and countermeasures. A significant number of them use machine learning, which is proven to be very effective in other domains. This survey, as one of the early attempts, presents the usage of machine...
journal article 2023
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Gomony, Manil Dev (author), de Putter, Floran (author), Gebregiorgis, A.B. (author), Paulin, Gianna (author), Mei, Linyan (author), Jain, Vikram (author), Hamdioui, S. (author), Bishnoi, R.K. (author), Sanchez, Victor (author)
With the rise of deep learning (DL), our world braces for artificial intelligence (AI) in every edge device, creating an urgent need for edge-AI SoCs. This SoC hardware needs to support high throughput, reliable and secure AI processing at ultra-low power (ULP), with a very short time to market. With its strong legacy in edge solutions and open...
conference paper 2023
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Zahedi, M.Z. (author), Custers, Geert (author), Shahroodi, T. (author), Gaydadjiev, G. (author), Wong, J.S.S.M. (author), Hamdioui, S. (author)
Performing analysis on large graph datasets in an energy-efficient manner has posed a significant challenge; not only due to excessive data movements and poor locality, but also due to the non-optimal use of high sparsity of such datasets. The latter leads to a waste of resources as the computation is also performed on zero's operands which do...
conference paper 2023
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Shahroodi, T. (author), Cardoso, Rafaela (author), Zahedi, M.Z. (author), Wong, J.S.S.M. (author), Bosio, Alberto (author), O'Connor, Ian (author), Hamdioui, S. (author)
This paper investigates the potential of a compute-in-memory core based on optical Phase Change Materials (oPCMs) to speed up and reduce the energy consumption of the Matrix-Matrix-Multiplication operation. The paper also proposes a new data mapping for Binary Neural Networks (BNNs) tailored for our oPCM core. The preliminary results show a...
conference paper 2023
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Yaldagard, Mohammad Amin (author), Diware, S.S. (author), Joshi, R.V. (author), Hamdioui, S. (author), Bishnoi, R.K. (author)
Resistive random access memory (RRAM) based computation-in-memory (CIM) architectures can meet the unprecedented energy efficiency requirements to execute AI algorithms directly on edge devices. However, the read-disturb problem associated with these architectures can lead to accumulated computational errors. To achieve the necessary level of...
conference paper 2023
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Xun, H. (author), Fieback, M. (author), Yuan, S. (author), Zhang, Ziwei (author), Taouil, M. (author), Hamdioui, S. (author)
Resistive Random Access Memory (RRAM) is a potential technology to replace conventional memories by providing low power consumption and high-density storage. As various manufacturing vendors make significant efforts to push it to high-volume production and commercialization, high-quality and efficient test solutions are of great importance. This...
conference paper 2023
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Fieback, M. (author), Bradarić, Filip (author), Taouil, M. (author), Hamdioui, S. (author)
Resistive Random Access Memory (RRAM, or ReRAM) is a promising memory technology to replace Flash because of its low power consumption, high storage density, and simple integration in existing IC production processes. This has motivated many companies to invest in this technology. However, RRAM manufacturing introduces new failure mechanisms and...
conference paper 2023
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Gomony, Manil Dev (author), Gebregiorgis, A.B. (author), Fieback, M. (author), Geilen, Marc (author), Stuijk, Sander (author), Richter-Brockmann, Jan (author), Bishnoi, R.K. (author), Taouil, M. (author), Hamdioui, S. (author)
This paper addresses one of the directions of the HORIZON EU CONVOLVE project being dependability of smart edge processors based on computation-in-memory and emerging memristor devices such as RRAM. It discusses how how this alternative computing paradigm will change the way we used to do manufacturing test. In addition, it describes how these...
conference paper 2023
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Zahedi, M.Z. (author), Shahroodi, T. (author), Wong, J.S.S.M. (author), Hamdioui, S. (author)
The vast potential of memristor-based computation-in-memory (CIM) engines has mainly triggered the mapping of best-suited applications. Nevertheless, with additional support, existing applications can also benefit from CIM. In particular, this paper proposes an energy and area-efficient CIM-based methodology to perform arithmetic signed...
journal article 2023
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Yuan, S. (author), Taouil, M. (author), Fieback, M. (author), Xun, H. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Rao, Sidharth (author), Couet, Sebastien (author), Hamdioui, S. (author)
The development of Spin-transfer torque magnetic RAM (STT-MRAM) mass production requires high-quality dedicated test solutions, for which understanding and modeling of manufacturing defects of the magnetic tunnel junction (MTJ) is crucial. This paper introduces and characterizes a new defect called Back-Hopping (BH); it also provides its...
conference paper 2023
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Ghasempouri, Tara (author), Raik, Jaan (author), Reinbrecht, Cezar (author), Hamdioui, S. (author), Taouil, M. (author)
According to the World Economic Forum, cyberattacks are considered as one of the most important sources of risk to companies and institutions worldwide. Attacks can target the network, software, and/or hardware. Over the years, much knowledge has been developed to understand and mitigate cyberattacks. However, new threats have appeared in...
journal article 2023
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Singh, A. (author), Bishnoi, R.K. (author), Kaichouhi, A. (author), Diware, S.S. (author), Joshi, R.V. (author), Hamdioui, S. (author)
Analog computation-in-memory (CIM) architecture alleviates massive data movement between the memory and the processor, thus promising great prospects to accelerate certain computational tasks in an energy-efficient manner. However, data converters involved in these architectures typically achieve the required computing accuracy at the expense...
conference paper 2023
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Diware, S.S. (author), Gebregiorgis, A.B. (author), Joshi, R.V. (author), Hamdioui, S. (author), Bishnoi, R.K. (author)
Memristor-based computation-in-memory (CIM) can achieve high energy efficiency by processing the data within the memory, which makes it well-suited for applications like neural networks. However, memristors suffer from conductance variation problem where their programmed conductance values deviate from the desired values. Such variations lead...
conference paper 2023
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Fieback, M. (author), Cardoso Medeiros, G. (author), Wu, L. (author), Aziza, Hassen (author), Bishnoi, R.K. (author), Taouil, M. (author), Hamdioui, S. (author)
Resistive RAM (RRAM) is a promising technology to replace traditional technologies such as Flash, because of its low energy consumption, CMOS compatibility, and high density. Many companies are prototyping this technology to validate its potential. Bringing this technology to the market requires high-quality tests to ensure customer...
journal article 2022
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Mahmoud, A.N.N. (author), Vanderveken, Frederic (author), Ciubotaru, Florin (author), Adelmann, Christoph (author), Hamdioui, S. (author), Cotofana, S.D. (author)
By their very nature Spin Waves (SWs) enable the realization of energy efficient circuits, as they propagate and interfere within waveguides without consuming noticeable energy. However, SW computing can be even more energy efficient by taking advantage of the approximate computing paradigm as many applications, e.g., multimedia and social...
journal article 2022
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Mahmoud, A.N.N. (author), Vanderveken, Frederic (author), Ciubotaru, Florin (author), Adelmann, Christoph (author), Hamdioui, S. (author), Cotofana, S.D. (author)
In this article, we propose an energy-efficient spin wave (SW)-based approximate 4:2 compressor including three- and five-input majority gates. We validate our proposal by means of micromagnetic simulations and assess and compare its performance with state-of-the-art SW 45-nm CMOS and spin-CMOS counterparts. The evaluation results indicate...
journal article 2022
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Wu, Lizhou (author), Rao, Siddharth (author), Taouil, M. (author), Marinissen, Erik Jan (author), Kar, Gouri Sankar (author), Hamdioui, S. (author)
The popularity of perpendicular magnetic tunnel junction (pMTJ)-based spin-transfer torque magnetic random access memories (STT-MRAMs) is growing very fast. The performance of such memories is very sensitive to magnetic fields, including both internal and external ones. This article presents a magnetic-field-aware compact model of pMTJ, named...
journal article 2022
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Bagbaba, Ahmet Cagri (author), Augusto da Silva, F. (author), Sonza Reorda, Matteo (author), Hamdioui, S. (author), Jenihhin, Maksim (author), Sauer, Christian (author)
ISO 26262 requires classifying random hardware faults based on their effects (safe, detected, or undetected) within integrated circuits used in automobiles. In general, this classification is addressed using expert judgment and a combination of tools. However, the growth of integrated circuit complexity creates a huge fault space; hence, this...
journal article 2022
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