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Vasudevan, R.A. (author), Poli, Isabella (author), Deligiannis, D. (author), Zeman, M. (author), Smets, A.H.M. (author)
Light-induced effects on the minority carrier lifetime of silicon heterojunction structures are studied through multiple-exposure photoconductance decay (MEPCD). MEPCD monitors the effect of the measurement flash from a photoconductance decay setup on a sample over thousands of measurements. Varying the microstructure of the intrinsic...
journal article 2016