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Shi, W. (author), Theelen, Mirjam (author), Illiberi, A (author), Barreau, Nicolas (author), Butterling, M. (author), Schut, H. (author), Zeman, M. (author), Brück, E.H. (author), Eijt, S.W.H. (author), More Authors (author)
Positron annihilation lifetime spectroscopy (PALS) and Doppler broadening positron annihilation spectroscopy DB-PAS) depth profiling demonstrate pronounced growth of vacancy clusters at the grain boundaries of as-deposited Al-doped ZnO films deposited as transparent conductive oxide (TCO) on Cu(In, Ga)Se2 (CIGS) solar cells upon accelerated...
journal article 2018
document
Shi, W. (author), Theelen, Mirjam (author), Illiberi, A (author), Barreau, Nicolas (author), van der Sar, S.J. (author), Butterling, M. (author), Schut, H. (author), Egger, Werner (author), Dickmann, Marcel (author), Hugenschmidt, Christoph (author), Zeman, M. (author), Brück, E.H. (author), Eijt, S.W.H. (author)
Positron annihilation lifetime spectroscopy (PALS) and Doppler broadening positron annihilation spectroscopy (DB-PAS) depth profiling demonstrate pronounced growth of vacancy clusters at the grain boundaries of as-deposited Al-doped ZnO films deposited as transparent conductive oxide (TCO) on Cu(In,Ga)Se2 (CIGS) solar cells upon accelerated...
journal article 2018
document
Melskens, J. (author), Eijt, S.W.H. (author), Schouten, M. (author), Vullers, A.S. (author), Mannheim, Awital (author), Schut, H. (author), Macco, Bart (author), Zeman, M. (author), Smets, A.H.M. (author)
The nanostructure of hydrogenated amorphous silicon (a-Si:H) is studied by means of doppler broadening positron annihilation spectroscopy (DB-PAS) and Fourier transform infrared (FTIR) spectroscopy. The evolution of open volume deficiencies is monitored during annealing, demonstrating that small vacancies and other small vacancy clusters that...
journal article 2017