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Shi, W. (author), Theelen, Mirjam (author), Illiberi, A (author), Barreau, Nicolas (author), Butterling, M. (author), Schut, H. (author), Zeman, M. (author), Brück, E.H. (author), Eijt, S.W.H. (author), More Authors (author)
Positron annihilation lifetime spectroscopy (PALS) and Doppler broadening positron annihilation spectroscopy DB-PAS) depth profiling demonstrate pronounced growth of vacancy clusters at the grain boundaries of as-deposited Al-doped ZnO films deposited as transparent conductive oxide (TCO) on Cu(In, Ga)Se2 (CIGS) solar cells upon accelerated...
journal article 2018