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Van Reijen, B. (author), Koch, N. (author), Lazurenko, A. (author), Weis, S. (author), Schirra, M. (author), Genovese, A. (author), Haderspeck, J. (author), Gill, E.K.A. (author)
The Thales diagnostic equipment for ion beam characterization consists of a gridded and single orifice retarding potential analyzer (RPA) and an energy selective mass spectrometer (ESMS). During the development phase of these sensors considerable effort was put into the removal of ion optical effects as well as to ensure equal ion transmission...
conference paper 2011