Searched for: faculty:"Applied%5C%2BSciences"
(1 - 5 of 5)
document
Jun, D.S. (author), Kutchoukov, V.G. (author), Kruit, P. (author)
A next generation ion source suitable for both high resolution focused ion beam milling and imaging applications is currently being developed. The new ion source relies on a method of which positively charged ions are extracted from a miniaturized gas chamber where neutral gas atoms become ionized by direct electron impact. The use of a very...
journal article 2011
document
Cook, B.J. (author), Verduin, T. (author), Hagen, C.W. (author), Kruit, P. (author)
Emission theory predicts that high brightness cold field emitters can enhance imaging in the electron microscope. This (neglecting chromatic aberration) is because of the large (coherent) probe current available from a high brightness source and is based on theoretically determined values of reduced brightnesses up to 1014?A/(m2?sr?V). However,...
journal article 2010
document
Hagen, C.W. (author), Fokkema, E. (author), Kruit, P. (author)
The virtual source size of a liquid metal ion source is an order of magnitude larger than the size of the region from which the ions are emitted at the source. This source size has a direct effect on the reduced brightness and, hence, on the performance of these sources. The variation of the virtual source size of a gallium liquid metal ion...
journal article 2008
document
Bronsgeest, M.S. (author), Barth, J.E. (author), Swanson, L.W. (author), Kruit, P. (author)
Probe size, shape, and current are important parameters for the performance of all probe forming systems such as the scanning (transmission) electron microscope, the focused ion beam microscope, and the Gaussian electron beam lithography system. Currently, however, the relation between probe current and probe size is ill defined. The key lies in...
journal article 2008
document
Kruit, P. (author), Bezuijen, M. (author), Barth, J.E. (author)
The potential application of carbon nanotubes as electron sources in electron microscopes is analyzed. The resolution and probe current that can be obtained from a carbon nanotube emitter in a low-voltage scanning electron microscope are calculated and compared to the state of the art using Schottky electron sources. Many analytical equations...
journal article 2006
Searched for: faculty:"Applied%5C%2BSciences"
(1 - 5 of 5)