Testability and Fault Tolerance for Emerging Nanoelectronic Memories

Emerging nanoelectronic memories such as Resistive Random Access Memories (RRAMs) are possible candidates to replace the conventional memory technologies such as SRAMs, DRAMs and flash memories in future computer systems. Despite their advantages such as enormous storage capacity, low-power per unit device and reduced manufacturing difficulties,...

Test Set Development for Cache Memory in Modern Microprocessors

Up to 53% of the time spent on testing current Intel microprocessors is needed to test on-chip caches, due to the high complexity of memory tests and to the large amount of transistors dedicated to such memories. This paper discusses the methodology used to develop effective and efficient cache tests, and the way it is implemented to optimize...

Testing of modern semiconductor memory structures

In this thesis, we study the problem of faults in modern semiconductor memory structures and their tests. According to the 2005 ITRS, the systems on chip (SoCs) are moving from logic and memory balanced chips to more memory dominated devices in order to cope with the increasing application requirements. The embedded memories are expected to...

PPM reduction on embedded memories in system on chip

This paper summarizes advanced test patterns designed to target dynamic and time-related faults caused by new defect mechanisms in deep-submicron memory technologies. Such tests are industrially evaluated together with the traditional tests at "Design of Systems on Silicon (DS2)" in Spain in order to (a) validate the used fault models and (b)...

DRAM fault analysis and test generation

Dynamic random access memories (DRAMs) are the most widely used type of memory in the market today, due to their important application as the main memory of the personal computer (PC). These memories are tested by their manufacturers in an ad hoc way, that results in an expensive test process the price of which is ultimately paid by the end...

Testing multi-port memories: Theory and practice