Searched for: subject:"Atomic%5C%2Bforce%5C%2Bmicroscopy"
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Chandrashekar, A. (author), Belardinelli, P. (author), Staufer, U. (author), Alijani, F. (author)
In this work, we perform a comprehensive analysis of the robustness of attractors in tapping mode atomic force microscopy. The numerical model is based on cantilever dynamics driven in the Lennard–Jones potential. Pseudo-arc-length continuation and basins of attraction are utilized to obtain the frequency response and dynamical integrity of...
journal article 2019
Rull Trinidad, E. (author), Gribnau, T.W. (author), Belardinelli, P. (author), Staufer, U. (author), Alijani, F. (author)
The accuracy of measurements in Amplitude Modulation Atomic Force Microscopy (AFM) is directly related to the geometry of the tip. The AFM tip is characterized by its radius of curvature, which could suffer from alterations due to repetitive mechanical contact with the surface. An estimation of the tip change would allow the user to assess...
journal article 2017