"uuid","repository link","title","author","contributor","publication year","abstract","subject topic","language","publication type","publisher","isbn","issn","patent","patent status","bibliographic note","access restriction","embargo date","faculty","department","research group","programme","project","coordinates"
"uuid:dd63017e-f364-4107-adad-f5b62187812c","http://resolver.tudelft.nl/uuid:dd63017e-f364-4107-adad-f5b62187812c","On the origin of amplitude reduction mechanism in tapping mode atomic force microscopy","Keyvani Janbahan, A. (TU Delft Structural Optimization and Mechanics; TNO); Sadeghian, Hamed (TNO; Eindhoven University of Technology); Goosen, J.F.L. (TU Delft Structural Optimization and Mechanics); van Keulen, A. (TU Delft Structural Optimization and Mechanics)","","2018","The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides a simple reasoning for the relationship between tip-sample interactions and operation parameters (amplitude and frequency). The proposed formulation, which attributes the amplitude reduction to an interference between the tip-sample and dither force, only deals with the linear part of the system; however, it fully agrees with experimental results and numerical solutions of the full nonlinear model of TM-AFM.","Continuum mechanics; Intermolecular forces; Newtonian mechanics; Atomic force microscopy; Fourier analysis; Nanopatterning; Nonlinear dynamics","en","journal article","","","","","","","","2019-04-20","","","Structural Optimization and Mechanics","","",""
"uuid:3a7fba78-86ec-4506-b3fe-c089c28b7c9c","http://resolver.tudelft.nl/uuid:3a7fba78-86ec-4506-b3fe-c089c28b7c9c","Chaos: The speed limiting phenomenon in dynamic atomic force microscopy","Keyvani Janbahan, A. (TU Delft Structural Optimization and Mechanics; TNO); Alijani, F. (TU Delft Dynamics of Micro and Nano Systems); Sadeghian, Hamed (Eindhoven University of Technology; TNO); Maturova, Klara (TNO); Goosen, J.F.L. (TU Delft Structural Optimization and Mechanics); van Keulen, A. (TU Delft Structural Optimization and Mechanics)","","2017","This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mode AFM strictly limits the imaging speed. We show that, if the controller of AFM is tuned to be faster than a certain threshold, the closed-loop system exhibits a chaotic behavior. The presence of chaos in the closed-loop dynamics is confirmed via bifurcation diagrams, PoincarĂ© sections, and Lyapunov exponents. Unlike the previously detected chaos due to attractive forces in the AFM, which can be circumvented via simple changes in operation parameters, this newly identified chaos is seemingly inevitable and imposes an upper limit for the closed-loop bandwidth of the AFM.","Atomic force microscopy; Control theory; Phase space methods; Chaotic systems; Attractors","en","journal article","","","","","","","","2018-12-01","","","Structural Optimization and Mechanics","","",""
"uuid:0239f9cc-0df8-44c7-981e-0403ae3189c3","http://resolver.tudelft.nl/uuid:0239f9cc-0df8-44c7-981e-0403ae3189c3","Helium ion beam induced growth of hammerhead AFM probes","Nanda, G.; Van Veldhoven, E.; Maas, D.; Sadeghian, H.; Alkemade, P.F.A.","","2015","The authors report the direct-write growth of hammerhead atomic force microscope(AFM) probes by He+beam induced deposition of platinum-carbon. In order to grow a thin nanoneedle on top of a conventional AFM probe, the authors move a focused He+beam during exposure to a PtC precursor gas. In the final growth stage, a perpendicular movement of the beam results in the required three-dimensional (hammerhead) shape. The diameter of the needle depends on the ion beam dose, beam dwell time, and speed of the beam movement. A nanoneedle radius below 10?nm and a hammerhead smaller than 35?nm have been achieved. This fabrication process is robust and enables precise control over the three-dimensions of the hammerhead AFM probe. Finally, the authors test the capabilities of the fabricated AFM probes for two-dimensional metrology of sidewall angles and line-edge roughness of trenches and shark-fins in silicon.","atomic force microscopy; ion beams; atomic force microscopes; silicon; semiconductor growth","en","journal article","American Institute of Physics","","","","","","","","Applied Sciences","QN/Quantum Nanoscience","","","",""