Searched for: subject:"Atomic%5C%2Bforce%5C%2Bmicroscopy"
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Keyvani Janbahan, A. (author), Sadeghian, Hamed (author), Goosen, J.F.L. (author), van Keulen, A. (author)
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides...
journal article 2018
Keyvani Janbahan, A. (author), Alijani, F. (author), Sadeghian, Hamed (author), Maturova, Klara (author), Goosen, J.F.L. (author), van Keulen, A. (author)
This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mode AFM strictly limits the imaging speed. We show that, if the...
journal article 2017