Searched for: subject:"Atomic%5C%2Bforce%5C%2Bmicroscopy"
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Nanda, G. (author), Van Veldhoven, E. (author), Maas, D. (author), Sadeghian, H. (author), Alkemade, P.F.A. (author)
The authors report the direct-write growth of hammerhead atomic force microscope(AFM) probes by He+beam induced deposition of platinum-carbon. In order to grow a thin nanoneedle on top of a conventional AFM probe, the authors move a focused He+beam during exposure to a PtC precursor gas. In the final growth stage, a perpendicular movement of the...
journal article 2015
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Keyvani Janbahan, A. (author), Sadeghian, Hamed (author), Goosen, J.F.L. (author), van Keulen, A. (author)
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides...
journal article 2018
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Keyvani Janbahan, A. (author), Alijani, F. (author), Sadeghian, Hamed (author), Maturova, Klara (author), Goosen, J.F.L. (author), van Keulen, A. (author)
This paper investigates the closed-loop dynamics of the Tapping Mode Atomic Force Microscopy using a new mathematical model based on the averaging method in Cartesian coordinates. Experimental and numerical observations show that the emergence of chaos in conventional tapping mode AFM strictly limits the imaging speed. We show that, if the...
journal article 2017