Searched for: subject:"Atomic%5C%2Bforce%5C%2Bmicroscopy"
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Keyvani Janbahan, A. (author), Sadeghian, Hamed (author), Goosen, J.F.L. (author), van Keulen, A. (author)
The origin of amplitude reduction in Tapping Mode Atomic Force Microscopy (TM-AFM) is typically attributed to the shift in resonance frequency of the cantilever due to the nonlinear tip-sample interactions. In this paper, we present a different insight into the same problem which, besides explaining the amplitude reduction mechanism, provides...
journal article 2018
Rull Trinidad, E. (author), Gribnau, T.W. (author), Belardinelli, P. (author), Staufer, U. (author), Alijani, F. (author)
The accuracy of measurements in Amplitude Modulation Atomic Force Microscopy (AFM) is directly related to the geometry of the tip. The AFM tip is characterized by its radius of curvature, which could suffer from alterations due to repetitive mechanical contact with the surface. An estimation of the tip change would allow the user to assess...
journal article 2017