Searched for: subject:"Atomic%5C%2Bforce%5C%2Bmicroscopy"
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Durkut, M. (author), Mas-Torrent, M. (author), Hadley, P. (author), Jonkheijm, P. (author), Schenning, A.P.H.J. (author), Meijer, E.W. (author), George, S. (author), Ajayaghosh, A. (author)
The electrical properties of supermolecular assemblies of oligo(p-phenylene vinylene) were studied. These materials self-assemble into well-defined cylindrical structures in solution with lengths in the range of 100?nm–10??m and diameters between 5 and 200?nm. Atomic force microscopy showed that by adjusting the concentration, either individual...
journal article 2006
Tans, S.J. (author), Miedema, R. (author), Geerligs, L.J. (author), Dekker, C. (author), Wu, J. (author), Wegner, G. (author)
journal article 1997