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Abarca Prouza, A.N. (author), Xie, S. (author), Markenhof, Jules (author), Theuwissen, A.J.P.A.M. (author)
In this work, a novel approach is presented for measuring relative temperature variations inside the pixel array of a CMOS image sensor itself. This approach can give important information when compensation for dark (current) fixed pattern noise (FPN) is needed. The test image sensor consists of pixels and temperature sensors pixels (=Tixels)....
conference paper 2017