Exploiting PUF Variation to Detect Fault Injection Attacks

The massive deployment of Internet of Things (IoT) devices makes them vulnerable against physical tampering attacks, such as fault injection. These kind of hardware attacks are very popular as they typically do not require complex equipment or high expertise. Hence, it is important that IoT devices are protected against them. In this work, we...

Hard-to-Detect Fault Analysis in FinFET SRAMs

Manufacturing defects can cause hard-to-detect (HTD) faults in fin field-effect transistor (FinFET) static random access memories (SRAMs). Detection of these faults, such as random read outputs and out-of-spec parametric deviations, is essential when testing FinFET SRAMs. Undetected HTD faults result in test escapes, which lead to early in-field...

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs

Manufacturing defects can cause faults in FinFET SRAMs. Of them, easy-to-detect (ETD) faults always cause incorrect behavior, and therefore are easily detected by applying sequences of write and read operations. However, hard-to-detect (HTD) faults may not cause incorrect behavior, only parametric deviations. Detection of these faults is of...

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs

Hard-to-detect faults such as weak and random faults in FinFET SRAMs represent an important challenge for manufacturing testing in scaled technologies, as they may lead to test escapes. This paper proposes a Design-for-Testability (DFT) scheme able to detect such faults by monitoring the bitline swing of FinFET memories. Using only five...