Searched for: subject:"Electron%5C+Backscatter%5C+diffraction%5C+%5C%28EBSD%5C%29"
(1 - 4 of 4)
document
Kumar, A. (author), Agarwal, G. (author), Petrov, R.H. (author), Goto, S. (author), Sietsma, J. (author), Herbig, M. (author)
The formation of White (WEL) and Brown Etching Layers (BEL) on rail raceways during service causes the initiation of microcracks which finally leads to failure. Detailed characterization of the WEL and the BEL in a pearlitic rail steel is carried out from micrometer to atomic scale to understand their microstructural evolution. A...
journal article 2019
document
Ghodrat, S. (author), Riemslag, A.C. (author), Kestens, L.A.I. (author)
Orientation contrast microscopy (i.e., electron backscattered diffraction, EBSD) was employed to monitor the plastic strain in loaded tensile samples of aluminium alloy Al6061 in T4 condition. The kernel average misorientation (KAM) is known to be an appropriate parameter in orientation contrast microscopy which has the potential to characterise...
journal article 2017
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De Knijf, D. (author), Nguyen-Minh, T. (author), Petrov, R.H. (author), Kestens, L.A.I. (author), Jonas, J.J. (author)
The orientation dependence of the austenite-to-martensite transformation during uniaxial tensile testing was modelled using the phenomenological theory of martensite crystallography and the mechanical driving force. It was validated experimentally by means of electron backscatter diffraction measurements on a pre-defined zone of a quenched and...
journal article 2014
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Tirumalasetty, G.K. (author), Van Huis, M.A. (author), Kwakernaak, C. (author), Sietsma, J. (author), Sloof, W.G. (author), Zandbergen, H.W. (author)
Uniaxial straining experiments were performed on a rolled and annealed Si-alloyed TRIP (transformation-induced plasticity) steel sheet in order to assess the role of its microstructure on the mechanical stability of austenite grains with respect to martensitic transformation. The transformation behavior of individual metastable austenite grains...
journal article 2012
Searched for: subject:"Electron%5C+Backscatter%5C+diffraction%5C+%5C%28EBSD%5C%29"
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