Searched for: subject%3A%22Feature%255C%252Bselection%22
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Perin, G. (author), Wu, L. (author), Picek, S. (author)
One of the main promoted advantages of deep learning in profiling side-channel analysis is the possibility of skipping the feature engineering process. Despite that, most recent publications consider feature selection as the attacked interval from the side-channel measurements is pre-selected. This is similar to the worst-case security...
journal article 2022
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Picek, S. (author), Heuser, Annelie (author), Jovic, Alan (author), Batina, Lejla (author)
Profiled side-channel attacks consist of several steps one needs to take. An important, but sometimes ignored, step is a selection of the points of interest (features) within side-channel measurement traces. A large majority of the related works start the analyses with an assumption that the features are preselected. Contrary to this...
journal article 2019