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Sun, B. (author), Fan, J. (author), Fan, Xuejun (author), Zhang, Kouchi (author)
This work studies the effect of randomness of LED's lumen depreciation on reliability of the entire LED lamp. An integrated LED light bulb is selected as carrier of the proposed method. A PoF based lumen depreciation model and electronic-thermal simulations are introduced for reliability prediction. The normal distribution is used to describe...
conference paper 2018