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Rull Trinidad, E. (author), Gribnau, T.W. (author), Belardinelli, P. (author), Staufer, U. (author), Alijani, F. (author)
The accuracy of measurements in Amplitude Modulation Atomic Force Microscopy (AFM) is directly related to the geometry of the tip. The AFM tip is characterized by its radius of curvature, which could suffer from alterations due to repetitive mechanical contact with the surface. An estimation of the tip change would allow the user to assess...
journal article 2017