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Wang, S. (author), Yang, Huiru (author), Zong, Qihang (author), Huang, Qianming (author), Tan, C. (author), Gao, Chenshan (author), Li, Shizhen (author), Ye, H. (author), Zhang, Kouchi (author), French, P.J. (author)
In recent years, metal crack-based stretchable flexible strain sensors have attracted significant attention in wearable device applications due to their extremely high sensitivity. However, the tradeoff between sensitivity and detection range has been an intractable dilemma, severely limiting their practical applications. Herein, we propose a...
journal article 2023
document
Wei, Xiaoguang (author), Liu, Y. (author), Shi, Jian (author), Gao, Shibin (author), Li, Xingpeng (author), Han, Zhu (author)
This article offers a novel perspective on identifying the critical branches under load redistribution (LR) attacks. Compared to the existing literature that is largely disruption-driven and based on dc state estimation, we propose to address the threat from LR attacks on a more fundamental level by modeling and analyzing the circulation of...
journal article 2023
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Rudneva, M. (author), Gao, B. (author), Prins, F. (author), Xu, Q. (author), Van der Zant, H.S.J. (author), Zandbergen, H.W. (author)
In situ transmission electron microscopy was performed on the electromigration in platinum (Pt) nanowires (14 nm thick, 200 nm wide, and 300 nm long) with and without feedback control. Using the feedback control mode, symmetric electrodes are obtained and the gap usually forms at the center of the Pt nanowire. Without feedback control,...
journal article 2013
document
Gao, J.R. (author), Hajenius, M. (author), Tichelaar, F.D. (author), Klapwijk, T.M. (author), Voronov, B. (author), Grishin, E. (author), Gol'tsman, G. (author), Zorman, C.A. (author), Mehregany, M. (author)
The authors have realized NbN (100) nanofilms on a 3C-SiC (100)/Si(100) substrate by dc reactive magnetron sputtering at 800?°C. High-resolution transmission electron microscopy (HRTEM) is used to characterize the films, showing a monocrystalline structure and confirming epitaxial growth on the 3C-SiC layer. A film ranging in thickness from 3.4...
journal article 2007
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