Comparison between a near-field and a far-field indexing approach for characterization of a polycrystalline sample volume containing more than 1500 grains

A comparison of the performance of X-ray diffraction tomography, a near-field diffraction technique, and a far-field diffraction technique for indexing X-ray diffraction data of polycrystalline materials has been carried out by acquiring two sets of diffraction data from the same polycrystalline sample volume. Both approaches used in this study...