Searched for: subject:"X%5C-ray%5C%2Bmicroscopy"
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Ishii, M. (author), Hamilton, B. (author), Poolton, N. (author)
We have observed the distribution of electron trapping centers on distorted carbon nanotubes (CNTs) by a unique x-ray analysis technique that has both elemental and spatial selectivities. This technique involves the use of scanning probe microscopy (SPM) under synchrotron radiation excitation of the inner shell of carbon. The probe detects the...
journal article 2008