Searched for: subject%3A%22classification%22
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document
de Jong, M.A. (author), Pool, D.M. (author), Mulder, Max (author)
Mathematical human controller (HC) models are widely used in tuning manual control systems and for understanding human performance. Typically, quasi-linear HC models are used, which can accurately capture the linear portion of HCs' behavior, averaged over a long measurement window. This paper presents a deep learning HC skill-level evaluation...
journal article 2022
document
de Jong, Martijn (author)
To fully optimize the synergy between human operators and machines in modern day’s highly automated vehicle control tasks, a real-time quantitative feedback of skill level is required. Direct feedback of skill level could be used to enable scalable levels of autonomy of the controlled system, or to provide a warning when sudden skill level...
master thesis 2021
document
de Jong, Richard J. (author), Uysal, Faruk (author), Heiligers, Matijs J.C. (author), de Wit, Jacco (author)
Camera systems are widely used for surveillance in the security and defense domains. The main advantages of camera systems are their high resolution, their ease of use, and the fact that optical imagery is easy to interpret for human operators. However, particularly when considering application in the defense domain, cameras have some...
conference paper 2020
document
de Jong, Richard (author)
Persistent surveillance is an urgent proficiency. For security, surveillance cameras are a strong asset as they support the automatic tracking of people and are directly interpretable by a human operator. Radar on the other hand can be used under a broad range of circumstances: radar can penetrate mediums such as clouds, fogs, mist and snow, and...
master thesis 2019
document
van der Walle, P (author), Kramer, E. (author), van der Donck, J.C.J. (author), Mulckhuyse, W (author), Nijsten, L. (author), Bernal Arango, F.A. (author), de Jong, A. (author), van Zeijl, E. (author), Spruit, H. E.T. (author), van den Berg, J.H. (author), Nanda, G. (author), van Langen-Suurling, A.K. (author), Alkemade, P.F.A. (author), Pereira, S.F. (author), Maas, D.J. (author)
Particle defects are important contributors to yield loss in semi-conductor manufacturing. Particles need to be detected and characterized in order to determine and eliminate their root cause. We have conceived a process flow for advanced defect classification (ADC) that distinguishes three consecutive steps; detection, review and...
conference paper 2017
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