Searched for: subject%3A%22curve%255C%252Bfitting%22
(1 - 1 of 1)
document
Rajagopal, Sricharan (author)
<br/>In recent years the Tapping Mode-Atomic Force Microscope (TM-AFM) has become one of the most important tools for imaging on the nanometer scale. In comparison with other contemporary technologies, the AFMs have been able to obtain atomic resolution both in high vacuum and liquid environments thus affirming their supremacy. The AFM can be...
master thesis 2017